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Microscopy Products, News, Events and Resources
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Microscopedia features an annotated guide to best online information about microscopes and microscopy. Learn about the different types of microscopes, their development, and applications.
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EDS in the TEM Explained
Oxford Instruments NanoAnalysis -
Movie Mode Dynamic Transmission Electron Microscopy (DTEM)
Dynamic Transmission Electron Microscope
Lawrence Livermore National Laboratory -
Does Your SEM Really Tell the Truth? - How would you know? Part 1
Three-Dimensional Nanometer Metrology
NIST Physical Measurement Laboratory (PML) -
Advances in high-resolution imaging – techniques for three-dimensional imaging of cellular structures
Super-Resolution Technology Core
University of New Mexico -
Three-dimensional electron crystallography of protein microcrystals
University of California Los Angeles -
Microscope Exchange
The Microscope Exchange -
The principal questions about electron microscopy are answered here
CEOS GmbH -
Chromatic correction: A revolution in electron microscopy
CEOS GmbH
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Recent News
Our mission is to find the most interesting news on advancements in microscope instrumentation and the discoveries made using microscopy to you. News from academic and government research labs, manufacturers, and societies are included.
Research and Innovations
University of Leeds Expands Structural Biology With Titan Krios TEMs
The Astbury Centre for Structural Molecular Biology at the University of Leeds in the United Kingdom has purchased two Titan Krios™ cryo transmission electron microscopes (cryo-TEMs) from FEI. The microscopes will be installed in a renovated facility in March of 2016.
Cryo-electron microscopy reveals structure of Bluetongue virus
Cryo-electron microscopy has revealed the atomic structure of the Bluetongue virus and has revealed how how the virus infects healthy cells. This understanding of the disease that has killed millions of cattle will aid in the develop of vaccines and treatments.
Elizabeth Hillman Wins BRAIN Initiative Grant for SCAPE
The $1.83 million three-year grant, part of the White House’s Brain Research through Advancing Innovative Neurotechnologies (BRAIN) Initiative, will support her work on SCAPE, a high-speed 3D microscope that she has developed for imaging the living brain.
Diamond Light Source places large microscope order with FEI
Two FEI Titan Krios cryo transmission electron microscopes (TEMs), a Scios DualBeam focused ion beam/scanning electron microscope (FIB/SEM), and a Talos cryo-TEM have been ordered by Diamond Light Source for the electron biology facility (EBIC).
Product and Company
Heptares Joins Pharma Consortium on Cryo-Electron Microscopy
Heptares Therapeutics has joined the Cambridge-Pharmaceutical Cryo-EM Consortium which will evaluate the potential of cryo-electron microscopy (cryo-EM) for determining three-dimensional (3D) information about protein structures at the molecular level.
FIB-SEM Composite Instrument from Hitachi at M & M 2015
Hitachi High-Technologies Corporation will introduce its new instrument, the NX9000, at Microscopy & Microanalysis 2015 in Portland, U.S.A. from August 2-6, 2015. The NX9000 is the second product created through the collaboration of Hitachi High-Tech and its subsidiary Hitachi High-Tech Science Corporation. This real-time 3D analytical FIB*1-SEM*2 composite instrument boasts improved 3D structural analysis precision and throughput, and can be used in applications of SEM observation, 3D EBSD, 3D EDS, TEM or atom probe sample preparation, and more. By arranging the SEM column and FIB column orthogonally, instead of diagonally, the NX9000 is optimized for improved throughput and precision in 3D structural analysis applications.
New Transmission Kikuchi Diffraction (TKD) detector head from Bruker
Bruker has launched the OPTIMUS™ TKD detector head for use with scanning electron microscope. The head can be easily interchanged with Bruker e-Flash EBSD detectors, so users have access to Transmission Kikuchi Diffraction (TKD) and EBSD with the same detector. OPTIMUS™ TKD provides a simple, cost-effective method of obtaining Selected Area Electron Diffraction (SAED) patterns like those acquired through TEM, and can be integrated with the ARGUS™ direct electron detection system to allow for bright field and dark field images.