Resources Scanning TEM

Investigations & Applications

About STEM

About STEM including the physics of scanning tranmission electron microscope and the delopment of the Brookhaven National Lab STEM.

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SuperSTEM

The SuperSTEM use an aberration corrected objective lens that simultaneously provides ultra-high resolution high angle annular dark field (HAADF) imaging and atomic-column electron energy loss spectroscopy (EELS) analysis of thin specimens. The Image gallery section includes brief summaries of significant results. The project section overviews current areas of application. It includes both metals and oxides as well as biological materials and electron irradiation-sensitive catalysts.

From: SuperSTEM, Daresbury Laboratory
SuperSTEM, Daresbury Laboratory
Authors: Dr Andrew Bleloch
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New views of materials through aberration-corrected STEM

The peer reviewed paper presents examples of the application of aberration-corrected scanning transmission electron microscopy to the study of complex oxides including determining atomic positions and the electronic structure for correlation with properties of the material.

From: , Oak Ridge National Laboratory
Oak Ridge National Laboratory
Authors: S. J. Pennycook and M. Varela
Citation: 1) 60 (suppl 1): S213-S223.
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Technical Overviews

Aberration-Corrected STEM: From Atomic Imaging and Analysis to Solving Energy Problems

Review article published in 2009 on the advancement in aberration corrected scanning transmission electron microscopy summerizes advancements with reference to applications in advancement materials characterization.

From: , Oak Ridge National Laboratory
Oak Ridge National Laboratory
Authors: S. Pennycook, M. Chisholm, A. Lupini, M. Varela, A. Borisevich, M.Oxley, W.Luo, K. van Benthem, S. Oh, D. L. Sales, S. Molina, J. García-Barriocanal, C. Leon, J. Santamaría, S. Rashkeev, S. Pantelides
Citation: Philosophical Transactions: Mathematical, Physical and Engineering Sciences
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