Resources Scanning Electron Microscopes

Nanomagnetic Imaging

NIST researchers have developed a modified form of scanning electron microscopy that can reveal the magnetic characteristics of such a surface without disturbing the magnetization.

From: , NIST Center for Nanoscale Science and Technology
NIST Center for Nanoscale Science and Technology
Authors: John Unguris
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Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy

The article describes an integrated scanning electron microscope and high numerical aperture epi-fluorescence microscope where the electron and optical axes aligned parallel to each other. This allows simultaneous imaging of the samples.

From:

Authors: Nalan Liv,1 A. Christiaan Zonnevylle,1 Angela C. Narvaez,1 Andries P. J. Effting,2 Philip W. Voorneveld,3 Miriam S. Lucas,4 James C. Hardwick,
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Electron microscope (FESEM)

Includes technical introduction to scanning and transmission electron microscopy with emphasise on FESEM and image gallery.

From: , Radboud University
Radboud University
Authors: Geert-Jan Janssen
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Learning Resources from FEI

Learn about the basics and capabilities of electron microscopy.

From: FEI Company
FEI Company
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Electron Microscopy

The goal of this site is to explain the basics of most electron microscopy methods without giving too much of the complex theory and mathematics behind it. Thus, reading these pages can in no way substitute the study of textbooks.

From: , Swiss Federal Institute of Technology (ETH-Zürich)
Swiss Federal Institute of Technology (ETH-Zürich)
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Scanning Electron Microscopy (SEM)

From: Science Education Resource Center, Carleton College
Science Education Resource Center, Carleton College
Authors: Susan Swapp
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SEM: Scanning Electron Microscope A to Z – Basic Knowledge for Using the SEM

An Ebook that includes the basic principals of operation, image display, the role of secondary and backscattered electron detectors, and the vacuum system. Further explanation of the SEM includes edge effect, the influence of accelerating voltage, the illumination effect of secondary and backscatter electron detectors, techniques for improving image resolution, benefits of different types of electron guns, elemental analysis, and sample preparation.

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SEM Q&A

A compilation of frequently asked questions received by the JEOL staff during demonstrations and training. Such as: how to mount powder samples, selecting the accelerating voltage, stereoscopic observation techniques, and more.

From: JEOL USA, Inc.
JEOL USA, Inc.
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Focused Ion Beam Systems and Dualbeam Systems

A section on focussed ion beam instruments is included in the FEI booklet "An Introduction to Electron Microscopy". The booklet is an excellent overview of of electron microscopy and nanotechnology for students and teachers. It is available as a pdf for download.

From: FEI Company
FEI Company
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The principal questions about electron microscopy are answered here

The developers of corrected electron optics, CEOS, have included a basics section that succinctly presents the basics of electron microscopy and aberration correction.

From: CEOS GmbH
CEOS GmbH
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Does Your SEM Really Tell the Truth? - How would you know? Part 1

Understanding how image aquisition and instrument calibration is essential when making measurements using a high resolution scanning electron microscope. As the resolution of scanning electron microscope has increased it is essential to understand the factors that can contribute to potenial measurement errors. This well written article is highly recomended for those using SEM imaging for quantification of specimen features. Part 1 is avaialble for free download fron the NIST. Part 2 covering specimen contamination and methods of contamination elimination and part 3 covering contamination are only available for purchase.

From: Three-Dimensional Nanometer Metrology, NIST Physical Measurement Laboratory (PML)
Three-Dimensional Nanometer Metrology, NIST Physical Measurement Laboratory (PML)
Authors: Michael T. Postek; Andras Vladar;
Citation: SCANNING VOL. 35, 355–361 (2013)
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Optimizing the Performance of a Tungsten Hairpin

To get the most out of a scanning electron microscope operators need to optimize the accelerating voltage, rightness of the electron gun, the working distance, and signal mix. This will produce the far more information and lead to a better understanding of samples.

Authors: S.K. Chapman
Citation: Scanning Microscopy Vol. 13, No. 1, 199
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ESEM Development and its Future

Dr. Danilatos pioneered the development of the Environmental scanning Electron Microscope (ESEM) starting 1978. The site includes an overview of the technology and the history of it's development. Included are a listing of patents and publications. Dr.

From: , ESEM Research Laboratory
ESEM Research Laboratory
Authors: GD Danilatos
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The Early History and Development of The Scanning Electron Microscope

From: , University of Cambridge
University of Cambridge
Authors: Bernie Breton
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Low Temperature Scanning Electron Microscopy of Snow Crystals

Samples of snow are studied by scanning electron microscopy to determine grain size and morphology at the Beltsville of the U.S. Department of Agriculture. Grain size and morphology are factors in estimating the water content of winter packed snow. Correlation with remote sensing is used for predication of flooding and estimating water supply. Images are in the public domain and available for use with proper citation.

Authors: Gary Bauchan and Charlie Murphy
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Electron Microscopy of Foods and Microorganisms

facinating site on the scanning electron microscopy of foods and food born bacteria. Images and articles from several microscopist are included.

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Scientific Working Group for Gunshot Residue

Scientific Working Group for Gunshot Residue makes recommendations for the forensic examination of gunshot residue. It is composed of 27 international experts. The pdf Primer Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive is a comprehensive guide that represents the mutually agreed upon opinions of the expert group. The site also includes a gallery of scanning electron microscope images, the results of contamination studies, and links to ASMT procedures.

From: Scientific Working Group for Gunshot Residue
Scientific Working Group for Gunshot Residue
Authors: Scientific Working Group for Gunshot Residue
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Microscopy and Hygiene

This easy to read article in pdf format presents examples of the uses electron microscopy to characterize bacteria and fungi in our digestive tract, on our skin, on money, and in food. There are many false colored images.

From: , Eastern Cereal and Oilseed Research Centre
Eastern Cereal and Oilseed Research Centre
Authors: Miloslav Kaláb
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Scanning Electron Microscope (SEM) Images of Building Materials

High quality scanning electron microscope images of building and construction materials and fabric are used to discuss the relationship of microscopic characteristics of porosity and the interconnection of pores to the flow of energy and water though the material.

Authors: Robert Bean, R.E.T., P.L.(Eng.)
Citation: Healthy Heating, www.healthyheating.com
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How Scanning Electron Microscopes Work

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Scanning Electron Microscope Basics

A detailed interactive animation that illustrate the basics of imaging in the Scanning Electron Microscope (SEM).

From: Imaging Technology Group, University of Illinois at Urbana-Champaign
Imaging Technology Group, University of Illinois at Urbana-Champaign
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Neuroscience’s Block Party

This is an easy to read overview of Serial block-face electron microscopy (SBEM). SBEM is where a utralmicrotome holding and embedded sample stained with metal ions is placed in the chamber of scanning electron microscope is providing high resolution images of cellular and subcellular organizaition.

Authors: Amy R. Volpert
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An Introduction to Electron Microscopy

The web version is a brief introduction that includes history and overview of the types of electron microscopes. The pdf version contains details on the instruments and the components, diagrams and stunning images. A power point presentation is available for classroom learning.

From: FEI Company
FEI Company
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The Virtual Microscope

The Virtual Microscope, which is available for free download supports functionality from electron, light, and scanning probe microscopes, datasets for these instruments, training materials to learn more about microscopy, and other related tools.

From: Imaging Technology Group, University of Illinois at Urbana-Champaign
Imaging Technology Group, University of Illinois at Urbana-Champaign
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Inspire STEM Education

Through the Inspire STEM Education website educators can request the use of a portable, easy to use TM3000 tabletop SEM. In response to STEM, President Obama's call to action for improvements in Science, Technology, Engineering, and Mathematics education, High Technologies America is seeking to increase interest in the study of nanoscience. The program includes teacher training and classroom materials are available on the Inspire STEM Education website. To request a TM3000, visit the Inspire STEM website.

From: Hitachi High Technologies America, Inc.
Hitachi High Technologies America, Inc.
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