Applications Materials

Investigations & Applications

New views of materials through aberration-corrected STEM

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The peer reviewed paper presents examples of the application of aberration-corrected scanning transmission electron microscopy to the study of complex oxides including determining atomic positions and the electronic structure for correlation with properties of the material.
Source:  Oak Ridge National Laboratory

Image Galleries

MEMS Video & Image Gallery

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Scanning electron microscope images of Silicon-Based Micro-Electro-Mechanical Systems (MEMS). Image categories include Bugs on MEMS, Dynamometer, Gears and Transmissions, Indexing Motors, Linear Racks, Microengines, Mirrors, Optical Encoders Shutters, Steam Engines, and Torsional Racheting Actuator. All images can be reproduct with credit to Sandia National Laboratories.
Source: MicroElectroMechanical Systems (MEMS) Sandia National Labs

Online Publications

Publications from the STEM Group at ORNL

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Journal publications on aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy are available in pdf format. The publications are grouped by overviews, techniques and material science applications. The overview 'Seeing the atoms more clearly: STEM imaging from the Crewe era to today' published in 2012 is recommended.
Source:  Oak Ridge National Laboratory

Technical Overviews

Aberration-Corrected STEM: From Atomic Imaging and Analysis to Solving Energy Problems

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Review article published in 2009 on the advancement in aberration corrected scanning transmission electron microscopy summerizes advancements with reference to applications in advancement materials characterization.
Source:  Oak Ridge National Laboratory