Hitachi High-Technologies Corporation will introduce its new instrument, the NX9000, at Microscopy & Microanalysis 2015 in Portland, U.S.A. from August 2-6, 2015. The NX9000 is the second product created through the collaboration of Hitachi High-Tech and its subsidiary Hitachi High-Tech Science Corporation. This real-time 3D analytical FIB*1-SEM*2 composite instrument boasts improved 3D structural analysis precision and throughput, and can be used in applications of SEM observation, 3D EBSD, 3D EDS, TEM or atom probe sample preparation, and more. By arranging the SEM column and FIB column orthogonally, instead of diagonally, the NX9000 is optimized for improved throughput and precision in 3D structural analysis applications.
The super-resolution K2 Summit camera for cryo-electron microscopy uses electron counting to record the highest resolution images with the lowest noise. This technology has enabled researchers to determine protein structures at 2.8 Å resolution and protective antigen pore structure at 2.9 Å resolution using single particle cryo-EM.
RISE Microscopy is, an integrated confocal raman imaging and scanning electron microscope system, has received the 2015 Photonics Prism Award as the top innovator in the metrology category. The system was developed by WITec and Tescan.
The new Aspirato™ module improves speed, accuracy and repeatability for focused ion beam ex situ specimen lift out, and facilitates optimal specimen placement on unique ExpressLO™ grids.
Second place in the Analytical Scientist Innovation Awards (TASIA) went to RISE Microscopy, a joint development of TESCAN and WITEC. Rise microscopy correlates Raman microspectroscopy with SEM imaging from the same sample area.
Using a transmission electron microscope (TEM) equiped with a Gatan K2® IS high speed direct detection camera Haimei Zheng from Lawrence Berkeley Laboratory found that crystals facet growth in a platinum nanocrystal is contrary to the equilibrium shape predicated by Gibbs theory.
Researchers at North Carolina State have developed a correction for sample drift resulting from expansion and contraction of the support rod during image acquisition in a scanning transmission electron microscope. The techniques, called Revolving STEM, improves imaging at the atomic level.