Scanning Electron Microscope 3D Measurement
MeX is a stand alone software package that turns any SEM with digital imaging into a true surface metrology device. Using stereoscopic images the software automatically retrieves 3D information and presents a highly accurate, robust and dense 3D dataset which is then used to perform traceable metrology examination. The results are obtained irrespective of the SEM magnification providing metrology at macro and micro levels
For details on products, please visit: 3D Measurement for SEMs
Electron Microscopy Sciences
Electron Microscopy Sciences is the most comprehensive source for electron microscopy, light microscopy, and histology supplies, chemicals and equipment. EMS is committed to providing the highest quality products along with competitive pricing, prompt delivery, and outstanding customer service.