UV-Visible-NIR Polarization Spectroscopy of Microscopic Samples
UV-visible-NIR range polarization spectroscopy capabilities have been incorporated in CRAIC Technologies microspectrophotometers. This gives the added capability of measurement of polarization spectra in either transmission or reflectance modes.
RISE Microscopy Receives TASIAs Award
Second place in the Analytical Scientist Innovation Awards (TASIA) went to RISE Microscopy, a joint development of TESCAN and WITEC. Rise microscopy correlates Raman microspectroscopy with SEM imaging from the same sample area.
New EDXRF for Wide Range of Sample Types
New bench-top EDXRF spectrometer from JEOL is an easy to use solution for analysis of major to trace components.
JEOL announces partnership with UC Irvine
JEOL USA and the Irvine Materials Research Institute (IMRI) at University of California have formed a partnership to create a new materials science and electron microscopy research facility. Dr. Xiaoqing Pan is joining the UC Irvine faculty in 2015 as head of the IMRI to lead the project. The study and development of new materials is expected to lead to advances in battery, solar cell, biological science, semiconductor and medical technologies. The facility will be called the JEOL Center for Nanoscale Solutions and will feature technologies such as: JEOL's highest performing Transmission Electron Microscopes (TEM); the high throughput JEM-2800 TEM/STEM for nano-analysis; the recently-introduced JEOL Grand ARM; and more.