Microscopy Products, News, Events and Resources

News and Events

Each section of microscopedia contains news on advancements in imaging technology, discoveries made using microscopes, new products, awards to microscopists, and the results of imaging contest. The news releases are from academic and government research labs and companies producing microscopes and accessories.

Web Resources

The best web resources for learning about microscopes and microscopy applications are included in each section.

Organizations

Connect to research laboratories, companies, and societies that focus on microscopes and their applications.

Recent News

Research and Innovations

View Jan 15

Expansion Microscopy Enlarges Specimens for Super Resolution

MIT researchers have used a swellable polymer network to physically expand specimens so that super resolution was obtainable using a convectional light microscope.

View Jan 15

AFM-MS of Thin layers of Painting Cross-Sections

Sub-micron size samples of mock-up painting cross-sections were collected by AFM based thermal desorption and analyzed separately by resonant two photon ionization coupled with mass spectrometry. With a spatial resolution of 750 nm the researchers demonstrated the they could extract samples from thin paint layers while maintaing the bulk sample. The technique will have wide application to cultural heritage paintings.

View Nov 14

Cryoelectron microscopy techniques are being used to study viruses hijack normal cellular processes to enter cells and to visualize V2 variable loop of the HIV Env protein in the Cheng Lab at the UC Davis.

View Oct 09

Vibrational spectroscopy in an STEM

Using a newly developed monochromtor and by optimizing the instrument, the energy resolution of electron energy loss spectroscopy in a scanning transmission electron microscope is around ten millielectronvolts which allows vibrational spectroscopy in the electron microscope. This will allow for use of powerful techniques that can analyse bonding arrangements and identify chemical compounds in the STEM.

Product and Company

View Nov 24

UV-Visible-NIR Polarization Spectroscopy of Microscopic Samples

UV-visible-NIR range polarization spectroscopy capabilities have been incorporated in CRAIC Technologies microspectrophotometers. This gives the added capability of measurement of polarization spectra in either transmission or reflectance modes.

View Jan 07

RISE Microscopy Receives TASIAs Award

Second place in the Analytical Scientist Innovation Awards (TASIA) went to RISE Microscopy, a joint development of TESCAN and WITEC. Rise microscopy correlates Raman microspectroscopy with SEM imaging from the same sample area.

View Jan 27

New EDXRF for Wide Range of Sample Types

New bench-top EDXRF spectrometer from JEOL is an easy to use solution for analysis of major to trace components.

View Jan 01

JEOL announces partnership with UC Irvine

JEOL USA and the Irvine Materials Research Institute (IMRI) at University of California have formed a partnership to create a new materials science and electron microscopy research facility. Dr. Xiaoqing Pan is joining the UC Irvine faculty in 2015 as head of the IMRI to lead the project. The study and development of new materials is expected to lead to advances in battery, solar cell, biological science, semiconductor and medical technologies. The facility will be called the JEOL Center for Nanoscale Solutions and will feature technologies such as: JEOL's highest performing Transmission Electron Microscopes (TEM); the high throughput JEM-2800 TEM/STEM for nano-analysis; the recently-introduced JEOL Grand ARM; and more.

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Quotes / About Microscopy and From Microscopists

  • "Nevertheless, this certainly was the cheapest electron microscope ever paid for by a German organization for the promotion of science. "
  • "...a lot of people will advise you. On the one hand you want to listen, and on the other hand you want to test it and say, ‘Okay, is this really making sense, or is it just that somebody I really respect said this?’”"
    Elizabeth Blackburn, PhD
  • "We replaced the wave length of the light by the wave length of electrons at an accelerating voltage of 75 kV and inserted into the Abbe relation the imaging accelerating voltage of 75 kV and inserted into the Abbe relation the imaging accelerating voltage of 75 kV and inserted into the Abbe relation the imaging aperture of 2 X 10-2 rad...we came up with a resolution limit of 2.2 Å ."
  • "It took me about twenty years before I had the right system that could be realized in practice and that scientist said it could work"